Investigation of the microstructure and chemical composition in micro-volumes.

Methods: Scanning Electron microscopy with X-Ray wave-length microanalysis.

1. Investigation of the microstructure

a)  Preparation of the polished grind, selection of the etching reagent and etching of the grind. Investigation of the microstructure (without quantitative statistical analysis)…
60 USD / sample - 1…2 hours

b)  Pictures of microstructural failures in secondary electrons (SEM)…
70 USD / sample - 1 work day

c)  Pictures of microstructural failures with data of  macro- and microchemical inhomogenity by SEM with Solid Pair Detector (atomic number contrast)…
85 USD / sample - 1 work day

d)  Investigation of the microstructure with using of the image analyzer and quantitatively statistical analysis.
1 work day; 

e)  Grain size, size distribution curves for the matrix and nonmetalic inclusions or separately phases in multiphase materials…
100 USD / sample - 2 work days

f)   Fractional analysis of powder conducted materials…
140 USD/sample - 2 work days

2. X-Ray (qualitative)

microanalysis with line or map distribution analysis (magnification  = 1000) …

170 USD / sample - 1…2 work days

3. Fractography (SEM) investigations with  customers samples. (without   sample preparation)Analysis of defects (pipelines, engineering parts etc.)

a)  Investigation of micro- mechanism of the fracture. Estimation of nucleation and propagation of the crack and influence of microstructure on these processes…
110 USD / sample - 2 work days

b)  Investigation of the micro- mechanism of the fracture and transition temperature of the fracture. Estimation of nucleation and propagation of the crack and influence of microstructure on these processes under testing at temperatures from -196 o C up to 300o C (specimens (3…5 pieces) with sizes of 3…4 mm in diameter, 30 mm length with central notch 0.5 mm) …
210 USD / investigation - 3…4 work days.

4.   Auger electron spectroscopy (AES)

a)  Sample preparation (angle laps)…
30 USD/specimen - 1…2 hours;

b)  Preparation of powder samples…
30 USD/specimen - 1 hour.

c)  Analysis of chemical composition of the surface…
220 USD/specimen; 1 work day;

d)  Depth profiling: - using angle laps...
220 USD/specimen - 1 work day;

     or ion etching
450 USD/specimen - 2…3 work days

e)  Investigation of chemical composition of samples fractured in the UHV …
450 USD / specimen

5.   Secondary Ion Mass-spectroscopy (SIMS)

a)  Sample preparation (angle laps)….
30 USD/specimen; 1…2 hours;

b)  Preparation of powder materials…
30 USD/specimen; 1 hour.

c)  Analysis of chemical composition of the surface…….
400 USD/specimen; 1 work day

6. X-Ray photoelectron spectroscopy (XPS, ESCA)

Plasmon losses spectroscopy, High resolution electron energy losses spectroscopy (HREELS), Analysis of the atomic structure of the surface (EELFS) are the specific scientists investigations and their prices will be estimated in dependence of aims of investigations
(400 USD/specimen…1700 USD/specimen) - 1 week….1 month.

 7. Differential thermal analysis

Of small samples (~ 1 g) from -196 to 1600 oC on air, in argon protective atmosphere or in vacuum 10-1 Pa…
100 USD/specimen - 1 work day

Analytical equipment:

1)  Electron spectrometry laboratory ESCALAB MK2 (X-ray sources: monochromatic Al anode and twin Al-Mg anode guns; electron sources: scanning electron gun LEG200 (spot size 200 nm) and source of monochromatic slow (up to 100 eV) electrons EMU; ion gun AG6; sample preparation: scraper, ion etching, device for samples fracture in UHV). Heating of samples up to 600 oC and cooling down to -196 oC are possible in the work and preparation chambers of the spectrometer.

2)  Scanning electron microscope JSM-U3 with X-ray wavelength spectrometer, Solid pair detector.

3)  Differential thermal analyzer SETARAM.

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